Invention Grant
- Patent Title: System and method for power supply testing
- Patent Title (中): 电源测试系统和方法
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Application No.: US12354250Application Date: 2009-01-15
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Publication No.: US08552849B2Publication Date: 2013-10-08
- Inventor: Wolfgang Scherr
- Applicant: Wolfgang Scherr
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: B60Q1/00
- IPC: B60Q1/00
Abstract:
In one embodiment, a method of verifying a component coupled to an output of a power supply includes measuring a frequency response from a control input of the power supply to the output of the power supply. The method also includes comparing the frequency response to a predetermined metric based on the measuring. The component is determined to be valid if the frequency response falls within the predetermined metric.
Public/Granted literature
- US20100177538A1 System and Method for Power Supply Testing Public/Granted day:2010-07-15
Information query
