Invention Grant
US08552994B2 Method and apparatus to measure self-capacitance using a single pin
有权
使用单个引脚测量自身电容的方法和装置
- Patent Title: Method and apparatus to measure self-capacitance using a single pin
- Patent Title (中): 使用单个引脚测量自身电容的方法和装置
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Application No.: US12567473Application Date: 2009-09-25
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Publication No.: US08552994B2Publication Date: 2013-10-08
- Inventor: Martin John Simmons
- Applicant: Martin John Simmons
- Applicant Address: US CA San Jose
- Assignee: Atmel Corporation
- Current Assignee: Atmel Corporation
- Current Assignee Address: US CA San Jose
- Agency: Baker Botts LLP
- Main IPC: G06F3/044
- IPC: G06F3/044

Abstract:
A method for measuring capacitance in a sensor device using an internal reference circuit element(s), and without implementing additional circuitry and devices external to the sensor device, is described. In some embodiments a method uses an output pin of the sensor device and an internal reference capacitor of the sensor device to identify a touch applied to a touch point or electrode coupled to the touch sensor. The method applies reference voltages to charge the reference capacitor and measure a signal received from an electrode, wherein the touch sensor controls switching within the touch sensor to apply the reference voltages to the reference capacitor.
Public/Granted literature
- US20110073383A1 METHOD AND APPARATUS TO MEASURE SELF-CAPACITANCE USING A SINGLE PIN Public/Granted day:2011-03-31
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