Invention Grant
US08553082B2 Distortion inspecting apparatus and distortion inspecting method 有权
变形检查装置和变形检查方法

  • Patent Title: Distortion inspecting apparatus and distortion inspecting method
  • Patent Title (中): 变形检查装置和变形检查方法
  • Application No.: US12602642
    Application Date: 2008-05-26
  • Publication No.: US08553082B2
    Publication Date: 2013-10-08
  • Inventor: Kikuhito Kawasue
  • Applicant: Kikuhito Kawasue
  • Applicant Address: JP Miyazaki
  • Assignee: University of Miyazaki
  • Current Assignee: University of Miyazaki
  • Current Assignee Address: JP Miyazaki
  • Agency: Osha Liang LLP
  • Priority: JP2007-147309 20070601
  • International Application: PCT/JP2008/059681 WO 20080526
  • International Announcement: WO2008/149712 WO 20081211
  • Main IPC: H04N7/18
  • IPC: H04N7/18
Distortion inspecting apparatus and distortion inspecting method
Abstract:
A distortion inspecting apparatus, which inspects perspective distortion of a transparent object, includes a projector that projects a plurality of display points arranged at predetermined intervals, a screen that displays an image projected by the projector thereon and allows the image to pass therethrough, a pedestal that disposes the transparent object at a position where the image passed through the screen, a camera that captures the image that passed through the transparent object, and a control device that stores a reference position coordinate of the image that passed through a reference transparent object, compares the reference position coordinate with an inspection position coordinate of the image that passed through the transparent object as an object to be inspected, and calculates a displacement quantity of the reference position coordinate.
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