Invention Grant
- Patent Title: Distortion inspecting apparatus and distortion inspecting method
- Patent Title (中): 变形检查装置和变形检查方法
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Application No.: US12602642Application Date: 2008-05-26
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Publication No.: US08553082B2Publication Date: 2013-10-08
- Inventor: Kikuhito Kawasue
- Applicant: Kikuhito Kawasue
- Applicant Address: JP Miyazaki
- Assignee: University of Miyazaki
- Current Assignee: University of Miyazaki
- Current Assignee Address: JP Miyazaki
- Agency: Osha Liang LLP
- Priority: JP2007-147309 20070601
- International Application: PCT/JP2008/059681 WO 20080526
- International Announcement: WO2008/149712 WO 20081211
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
A distortion inspecting apparatus, which inspects perspective distortion of a transparent object, includes a projector that projects a plurality of display points arranged at predetermined intervals, a screen that displays an image projected by the projector thereon and allows the image to pass therethrough, a pedestal that disposes the transparent object at a position where the image passed through the screen, a camera that captures the image that passed through the transparent object, and a control device that stores a reference position coordinate of the image that passed through a reference transparent object, compares the reference position coordinate with an inspection position coordinate of the image that passed through the transparent object as an object to be inspected, and calculates a displacement quantity of the reference position coordinate.
Public/Granted literature
- US20100182423A1 DISTORTION INSPECTING APPARATUS AND DISTORTION INSPECTING METHOD Public/Granted day:2010-07-22
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