Invention Grant
US08553980B2 Method and apparatus extracting feature points and image based localization method using extracted feature points
有权
方法和装置提取特征点和基于图像的定位方法使用提取的特征点
- Patent Title: Method and apparatus extracting feature points and image based localization method using extracted feature points
- Patent Title (中): 方法和装置提取特征点和基于图像的定位方法使用提取的特征点
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Application No.: US12844259Application Date: 2010-07-27
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Publication No.: US08553980B2Publication Date: 2013-10-08
- Inventor: Sung Hwan Ahn , Kyung Shik Roh , Suk June Yoon , Seung Yong Hyung
- Applicant: Sung Hwan Ahn , Kyung Shik Roh , Suk June Yoon , Seung Yong Hyung
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2009-0073730 20090811
- Main IPC: G06K9/34
- IPC: G06K9/34

Abstract:
Disclosed herein are a method and apparatus for extracting feature points using hierarchical image segmentation and an image based localization method using the extracted feature points. An image is segmented using an affinity degree obtained using information observed during position estimation, new feature points are extracted from segmented areas in which registered feature points are not included, and position estimation is performed based on the new feature points. Accordingly, stable and reliable localization may be performed.
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