Invention Grant
- Patent Title: Simple matrix method for stray-light correction in imaging instruments
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Application No.: US12228495Application Date: 2008-08-13
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Publication No.: US08554009B2Publication Date: 2013-10-08
- Inventor: Yuqin Zong , Steven W. Brown , Keith R. Lykke , Yoshihiro Ohno
- Applicant: Yuqin Zong , Steven W. Brown , Keith R. Lykke , Yoshihiro Ohno
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of Commerce (NIST)
- Current Assignee: The United States of America as represented by the Secretary of Commerce (NIST)
- Current Assignee Address: US DC Washington
- Agency: Burton IP Law Group
- Agent Daphne L. Burton
- Main IPC: G06K9/40
- IPC: G06K9/40

Abstract:
A simple matrix method and computer program product for stray-light correction in imaging instruments is provided. The stray-light correction method includes receiving raw signals from an imaging instrument and characterizing the imaging instrument for a set of point spread functions. For high resolution imaging instruments, the raw signals may be compressed to reduce the size of the correction matrix. Based on stray-light distribution functions derived from the point spread functions, a correction matrix is derived. This fast correction is performed by a matrix multiplication to the measured raw signals, and may reduce stray-light errors by more than one order of magnitude. Using the stray-light corrected instrument, significant reductions may be made in overall measurement uncertainties in radiometry, colorimetry, photometry and other applications. Because the PSFs may include other types of undesired responses, the stray-light correction also eliminates other types of errors, e.g., interreflection between a CCD and the detector window.
Public/Granted literature
- US20090059210A1 Simple matrix method for stray-light correction in imaging instruments Public/Granted day:2009-03-05
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