Invention Grant
- Patent Title: Method for inspection of materials for defects
- Patent Title (中): 检查缺陷材料的方法
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Application No.: US13752636Application Date: 2013-01-29
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Publication No.: US08554328B2Publication Date: 2013-10-08
- Inventor: Boozarjomehr Faraji , Kevin Jun Ha , Neil Hamilton Talbot , James Singleton Little , Robert J. Greenberg
- Applicant: Second Sight Medical Products, Inc.
- Applicant Address: US CA Sylmar
- Assignee: Second Sight Medical Products, Inc.
- Current Assignee: Second Sight Medical Products, Inc.
- Current Assignee Address: US CA Sylmar
- Agent Scott B. Dunbar
- Main IPC: A61N1/00
- IPC: A61N1/00
Abstract:
The present invention is a non-destructive method of inspecting a bond, particularly a braze bond, in a hermetic package. The invention involves a unique hermetic package design adapted for ultrasonic inspection and a method of inspecting the package. This package and non-destructive inspection process are particularly useful in implantable neural stimulators such as visual prostheses.
Public/Granted literature
- US20130144368A1 Method for Inspection of Materials for Defects Public/Granted day:2013-06-06
Information query
