Invention Grant
US08554502B2 Method for calculating probe mounting position in on-machine measuring device
有权
在机器测量装置上计算探头安装位置的方法
- Patent Title: Method for calculating probe mounting position in on-machine measuring device
- Patent Title (中): 在机器测量装置上计算探头安装位置的方法
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Application No.: US13026215Application Date: 2011-02-12
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Publication No.: US08554502B2Publication Date: 2013-10-08
- Inventor: Yonpyo Hon , Kenzo Ebihara , Masayuki Hamura
- Applicant: Yonpyo Hon , Kenzo Ebihara , Masayuki Hamura
- Applicant Address: JP Yamanashi
- Assignee: Fanuc Corporation
- Current Assignee: Fanuc Corporation
- Current Assignee Address: JP Yamanashi
- Agency: Lowe, Hauptman & Ham
- Priority: JP2010-082095 20100331
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A measurement program is created for measurement performed by moving X- and Z-axes so that a central axis of a probe is perpendicular to the surface of a reference sphere, and errors are obtained between original probe position data and probe position data obtained by measurement performed at two different angles θ1 and θ2 of a rotary axis according to the created measurement program. Position coordinates of a tip end of the probe at the two different angles θ1 and θ2 of the rotary axis are corrected so that the errors are zero. Then, the X- and Z-axis coordinates are corrected based on a positive or negative phased shift amount, and measurement errors are obtained by calculation. A real probe tip position is defined by the X- and Z-axis coordinates corrected by a correction amount with which the obtained measurement errors become minimum.
Public/Granted literature
- US20110246115A1 METHOD FOR CALCULATING PROBE MOUNTING POSITION IN ON-MACHINE MEASURING DEVICE Public/Granted day:2011-10-06
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