Invention Grant
- Patent Title: Method for calibrating a thickness gauge
- Patent Title (中): 校准厚度计的方法
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Application No.: US12992993Application Date: 2009-04-21
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Publication No.: US08554503B2Publication Date: 2013-10-08
- Inventor: Günter Schallmoser , Karl Wisspeintner , Robert Wagner
- Applicant: Günter Schallmoser , Karl Wisspeintner , Robert Wagner
- Applicant Address: DE Orgenburg
- Assignee: Micro-Epsilon Messetechnik GmbH
- Current Assignee: Micro-Epsilon Messetechnik GmbH
- Current Assignee Address: DE Orgenburg
- Agency: Alston & Bird LLP
- Priority: DE102008023987 20080516; DE102009011122 20090303
- International Application: PCT/DE2009/000517 WO 20090421
- International Announcement: WO2009/138053 WO 20091119
- Main IPC: G01C25/00
- IPC: G01C25/00 ; G01B5/06 ; G01B21/08
Abstract:
A method for calibration of a thickness gauge is provided in which the thickness gauge measures the thickness of a measured object in a stipulated measurement direction with at least one displacement sensor, operating contactless or by scanning, a reference object with known thickness and shape being brought into at least one partial area of the measurement field of the at least one displacement sensor.
Public/Granted literature
- US20110125442A1 METHOD FOR CALIBRATING A THICKNESS GAUGE Public/Granted day:2011-05-26
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