Invention Grant
US08554505B2 System and method for calibrating and monitoring the condition of a sensor device
有权
用于校准和监测传感器设备状态的系统和方法
- Patent Title: System and method for calibrating and monitoring the condition of a sensor device
- Patent Title (中): 用于校准和监测传感器设备状态的系统和方法
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Application No.: US12119874Application Date: 2008-05-13
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Publication No.: US08554505B2Publication Date: 2013-10-08
- Inventor: Marcus Vayhinger
- Applicant: Marcus Vayhinger
- Applicant Address: CH Greifensee
- Assignee: Mettler-Toledo AG
- Current Assignee: Mettler-Toledo AG
- Current Assignee Address: CH Greifensee
- Agency: Standley Law Group LLP
- Main IPC: G01F25/00
- IPC: G01F25/00

Abstract:
A system and method allow a sensor device that is used in a process stream to be efficiently calibrated and monitored as to its operating condition. The sensor device is a measuring probe with a sensor portion, a memory device and an electrical input/output port, arranged so the memory device is in communication with both the sensor portion and the input/output port. The sensor device may be connected through an electrical connector to either a first external source, such as a personal computer having an input/output port, remote from the process stream, or a second external source, such as a transmitter, proximate to the process stream. Operating software is accessible to at least the first external source for monitoring and calibrating. Database software is accessible to each of the external sources, for storing data on every measuring probe used in the system.
Public/Granted literature
- US20090287445A1 SYSTEM AND METHOD FOR CALIBRATING AND MONITORING THE CONDITION OF A SENSOR DEVICE Public/Granted day:2009-11-19
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