Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
-
Application No.: US12997943Application Date: 2009-09-18
-
Publication No.: US08554514B2Publication Date: 2013-10-08
- Inventor: Kazuhiro Yamamoto , Toshiyuki Okayasu
- Applicant: Kazuhiro Yamamoto , Toshiyuki Okayasu
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ladas & Parry, LLP
- International Application: PCT/JP2009/004762 WO 20090918
- International Announcement: WO2011/033588 WO 20110324
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A data signal is transmitted synchronously with a clock signal, and contains n phases (n represents an integer of 2 or more) of data for each cycle of the clock signal. A first time to digital converter generates clock change point information which represents the change timing of the clock signal. A second time to digital converter receives a data sequence in increments of cycles of the clock signal, and generates data change point information items which represent the change timing of the data in increments of phases of the data. A calculation unit calculates difference data between the change timing represented by the data change point information and the change point timing represented by the clock change point information in increments of phases. A judgment unit judges a DUT based upon the difference data received from the calculation unit.
Public/Granted literature
- US20110202296A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-08-18
Information query