Invention Grant
- Patent Title: Evaluating performance of binary classification systems
- Patent Title (中): 评估二进制分类系统的性能
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Application No.: US11612004Application Date: 2006-12-18
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Publication No.: US08554622B2Publication Date: 2013-10-08
- Inventor: Richard Tao-Hwa Chow , Pavel Berkhin , Elena Eneva , Boris Klots , Nicolas Eddy Mayoraz , Rajesh Girish Parekh
- Applicant: Richard Tao-Hwa Chow , Pavel Berkhin , Elena Eneva , Boris Klots , Nicolas Eddy Mayoraz , Rajesh Girish Parekh
- Applicant Address: US CA Sunnyvale
- Assignee: Yahoo! Inc.
- Current Assignee: Yahoo! Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: G06Q30/00
- IPC: G06Q30/00

Abstract:
Methods and apparatus are described for evaluating a binary classification system operable to classify each of a plurality of events as a first event type or a second event type. At least some of the events of the first event type are independently verifiable with reference to verification data. The binary classification system is susceptible to a first error type in which events of the first event type are classified as the second event type, and a second error type in which events of the second event type are classified as the first event type. Operation of a first configuration of the binary classification system is evaluated with reference to an objective function. The objective function is derived by expressing a number of errors of the second error type in terms of a number of errors of the first error type with reference to the verification data, and by assuming relative proportions of the first and second event types within the plurality of events.
Public/Granted literature
- US20080148106A1 EVALUATING PERFORMANCE OF BINARY CLASSIFICATION SYSTEMS Public/Granted day:2008-06-19
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