Invention Grant
US08555217B1 Integrated circuit design software with cross probing between tool graphical user interfaces (GUIs)
有权
集成电路设计软件，在工具图形用户界面（GUI）之间进行交叉探测
- Patent Title: Integrated circuit design software with cross probing between tool graphical user interfaces (GUIs)
- Patent Title (中): 集成电路设计软件，在工具图形用户界面（GUI）之间进行交叉探测
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Application No.: US13164108Application Date: 2011-06-20
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Publication No.: US08555217B1Publication Date: 2013-10-08
- Inventor: James Khong , Xiaoming Ma , Justin Wu
- Applicant: James Khong , Xiaoming Ma , Justin Wu
- Applicant Address: US OR Hillsboro
- Assignee: Lattice Semiconductor Corporation
- Current Assignee: Lattice Semiconductor Corporation
- Current Assignee Address: US OR Hillsboro
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06T1/00 ; G06F13/14 ; G06F3/00 ; G06F9/44
Abstract:
In one embodiment, an integrated circuit design tool is provided that includes a main window graphical user interface (GUI) and several tool GUIs. Cross probing of features from a source tool GUI to a target tool GUI occurs by the source tool GUI transmitting a probe request to the main window GUI; wherein the probe request identifies one or more cross-probed features for the target tool GUI. In response, the main window GUI commands a plug-in installation of the target tool GUI if the target tool GUI has not yet been instantiated. The main window GUI transmits a notification of the probe request to the target tool GUI. In response, the target tool GUI displays the cross-probed features.
Information query
