Invention Grant
US08559256B2 Non-volatile memory device and sensing method thereof 有权
非易失性存储器件及其感测方法

  • Patent Title: Non-volatile memory device and sensing method thereof
  • Patent Title (中): 非易失性存储器件及其感测方法
  • Application No.: US13212369
    Application Date: 2011-08-18
  • Publication No.: US08559256B2
    Publication Date: 2013-10-15
  • Inventor: Dong Keun Kim
  • Applicant: Dong Keun Kim
  • Applicant Address: KR Icheon
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2011-0044206 20110511
  • Main IPC: G11C7/00
  • IPC: G11C7/00
Non-volatile memory device and sensing method thereof
Abstract:
A non-volatile memory device and a sensing method thereof are disclosed, which can sense multi-level data using resistance variation. The non-volatile memory device includes a cell array and a sensing unit. The cell array includes a plurality of unit cells where data is read out or written. The sensing unit compares a sensing voltage corresponding to data stored in the unit cell with a reference voltage, amplifies/outputs the compared result, measures a difference in discharge time where the sensing voltage is discharged in response to a resistance value of the unit cell during an activation period of a sensing enable signal after a bit line is precharged, and senses the data in response to the measured result.
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