Invention Grant
- Patent Title: Non-volatile memory device and sensing method thereof
- Patent Title (中): 非易失性存储器件及其感测方法
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Application No.: US13212369Application Date: 2011-08-18
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Publication No.: US08559256B2Publication Date: 2013-10-15
- Inventor: Dong Keun Kim
- Applicant: Dong Keun Kim
- Applicant Address: KR Icheon
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon
- Priority: KR10-2011-0044206 20110511
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A non-volatile memory device and a sensing method thereof are disclosed, which can sense multi-level data using resistance variation. The non-volatile memory device includes a cell array and a sensing unit. The cell array includes a plurality of unit cells where data is read out or written. The sensing unit compares a sensing voltage corresponding to data stored in the unit cell with a reference voltage, amplifies/outputs the compared result, measures a difference in discharge time where the sensing voltage is discharged in response to a resistance value of the unit cell during an activation period of a sensing enable signal after a bit line is precharged, and senses the data in response to the measured result.
Public/Granted literature
- US20120287730A1 NON-VOLATILE MEMORY DEVICE AND SENSING METHOD THEREOF Public/Granted day:2012-11-15
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