Invention Grant
- Patent Title: XRF system having multiple excitation energy bands in highly aligned package
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Application No.: US12920641Application Date: 2009-03-03
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Publication No.: US08559597B2Publication Date: 2013-10-15
- Inventor: Zewu Chen , David M. Gibson , Walter M. Gibson , Adam Bailey , R. Scott Semken , Kai Xin , John H. Burdett
- Applicant: Zewu Chen , David M. Gibson , Walter M. Gibson , Adam Bailey , R. Scott Semken , Kai Xin , John H. Burdett
- Applicant Address: US NY East Greenbush
- Assignee: X-Ray Optical Systems, Inc.
- Current Assignee: X-Ray Optical Systems, Inc.
- Current Assignee Address: US NY East Greenbush
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Jeff Klembczyk; Kevin P. Radigan, Esq.
- International Application: PCT/US2009/035847 WO 20090303
- International Announcement: WO2009/111454 WO 20090911
- Main IPC: G21K1/06
- IPC: G21K1/06

Abstract:
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
Public/Granted literature
- US20110170666A1 XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE Public/Granted day:2011-07-14
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