Invention Grant
US08560903B2 System and method for executing functional scanning in an integrated circuit environment 有权
用于在集成电路环境中执行功能扫描的系统和方法

System and method for executing functional scanning in an integrated circuit environment
Abstract:
An example method is provided and includes executing a functional test for an integrated circuit and observing a failure associated with the integrated circuit. The method also includes executing a functional scan mode in order to reproduce the failure associated with the integrated circuit. A functional state of the integrated circuit is locked when the failure occurs, and the functional state is subsequently recovered for a structure test for the integrated circuit. In more particular embodiments, particular states of the functional test are evaluated and compared against other states associated with a model circuit that did not experience any failure in order to identify a latest cycle of the integrated circuit that could trigger the failure and an earliest cycle of the integrated circuit that could observe the failure.
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