Invention Grant
US08560903B2 System and method for executing functional scanning in an integrated circuit environment
有权
用于在集成电路环境中执行功能扫描的系统和方法
- Patent Title: System and method for executing functional scanning in an integrated circuit environment
- Patent Title (中): 用于在集成电路环境中执行功能扫描的系统和方法
-
Application No.: US12873135Application Date: 2010-08-31
-
Publication No.: US08560903B2Publication Date: 2013-10-15
- Inventor: Zhiyuan Wang , Xinli Gu , Zhanglei Wang , Hongxia Fang
- Applicant: Zhiyuan Wang , Xinli Gu , Zhanglei Wang , Hongxia Fang
- Applicant Address: US CA San Jose
- Assignee: Cisco Technology, Inc.
- Current Assignee: Cisco Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Patent Capital Group
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An example method is provided and includes executing a functional test for an integrated circuit and observing a failure associated with the integrated circuit. The method also includes executing a functional scan mode in order to reproduce the failure associated with the integrated circuit. A functional state of the integrated circuit is locked when the failure occurs, and the functional state is subsequently recovered for a structure test for the integrated circuit. In more particular embodiments, particular states of the functional test are evaluated and compared against other states associated with a model circuit that did not experience any failure in order to identify a latest cycle of the integrated circuit that could trigger the failure and an earliest cycle of the integrated circuit that could observe the failure.
Public/Granted literature
- US20120053924A1 SYSTEM AND METHOD FOR EXECUTING FUNCTIONAL SCANNING IN AN INTEGRATED CIRCUIT ENVIRONMENT Public/Granted day:2012-03-01
Information query