Invention Grant
- Patent Title: Method and apparatus for measuring properties of a compound
- Patent Title (中): 用于测量化合物性质的方法和装置
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Application No.: US12986160Application Date: 2011-01-06
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Publication No.: US08565376B2Publication Date: 2013-10-22
- Inventor: Ling Jian Meng
- Applicant: Ling Jian Meng
- Applicant Address: US IL Urbana
- Assignee: The Board of Trustees of the University of Illinois
- Current Assignee: The Board of Trustees of the University of Illinois
- Current Assignee Address: US IL Urbana
- Agency: Guntin & Gust, PLC
- Agent Ed Guntin
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01T1/36 ; G21K1/02

Abstract:
A system that incorporates teachings of the present disclosure may include, for example, an apparatus having a collimator having at least one aperture and a fluorescence detector. The collimator can be positioned next to a compound. The compound can emit fluorescence X-rays when impacted by an X-ray beam generated by an X-ray source. The collimator can absorb at least a first portion of the fluorescence X-rays emitted by the compound and release at least a second portion of the fluorescence X-rays at the at least one aperture. The second portion of the fluorescence X-rays released by the at least one aperture have known directional information based on a position of the collimator. The fluorescence detector can detect the second portion of the fluorescence X-rays released by the at least one aperture. A three-dimensional (3-D) rendering of an elemental distribution of the compound can be determined from the fluorescence X-rays detected and the directional information. Additional embodiments are disclosed.
Public/Granted literature
- US20110188629A1 METHOD AND APPARATUS FOR MEASURING PROPERTIES OF A COMPOUND Public/Granted day:2011-08-04
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