Invention Grant
- Patent Title: Circuit and method for diagnosing scan chain failures
- Patent Title (中): 用于诊断扫描链失败的电路和方法
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Application No.: US13093942Application Date: 2011-04-26
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Publication No.: US08566657B2Publication Date: 2013-10-22
- Inventor: Sandeep Kumar Goel
- Applicant: Sandeep Kumar Goel
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A method includes shifting a first logic sequence into a first scan chain having a first plurality of scan blocks coupled together, outputting a second logic sequence from each of the plurality of scan blocks in the first scan chain to a respective scan block in a second scan chain, and shifting a third logic sequence out of the second scan chain. At least one improperly functioning scan block of the first scan chain is identified based on the third logic sequence shifted out of the second scan chain.
Public/Granted literature
- US20120278671A1 CIRCUIT AND METHOD FOR DIAGNOSING SCAN CHAIN FAILURES Public/Granted day:2012-11-01
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