Invention Grant
US08566657B2 Circuit and method for diagnosing scan chain failures 有权
用于诊断扫描链失败的电路和方法

Circuit and method for diagnosing scan chain failures
Abstract:
A method includes shifting a first logic sequence into a first scan chain having a first plurality of scan blocks coupled together, outputting a second logic sequence from each of the plurality of scan blocks in the first scan chain to a respective scan block in a second scan chain, and shifting a third logic sequence out of the second scan chain. At least one improperly functioning scan block of the first scan chain is identified based on the third logic sequence shifted out of the second scan chain.
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