Invention Grant
- Patent Title: Integrated functional testing mechanism for integrated circuits
- Patent Title (中): 集成电路集成功能测试机制
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Application No.: US12972757Application Date: 2010-12-20
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Publication No.: US08572449B1Publication Date: 2013-10-29
- Inventor: Sivakumar Ardhanari , Vardhamana G Hegde , Madhanagopalan Sambath Kumar , Balakuteswar V Voleti
- Applicant: Sivakumar Ardhanari , Vardhamana G Hegde , Madhanagopalan Sambath Kumar , Balakuteswar V Voleti
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: DeLizio Gilliam, PLLC
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An on-chip testing unit can be implemented in an integrated circuit (e.g., a SoC) to validate the operation of cache memories associated with a processor of the integrated circuit. For each testing instruction to be executed by the processor for testing a cache memory, the testing unit can intercept information (e.g., address, data, and/or control signals) generated by the processor in response to executing the instruction. The testing unit can determine whether information generated by the processor matches corresponding expected information associated with the instruction. This can enable the testing unit to determine whether the processor can correctly identify an address from which the next instruction is to be fetched, can ensure consistency between data in the cache memories and persistent storage devices, and whether the processor is operating as expected. An error notification can be generated if the information generated by the processor does not match the expected information.
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