Invention Grant
- Patent Title: Method and apparatus for analyzing a design of an integrated circuit using fault costs
- Patent Title (中): 使用故障成本分析集成电路设计的方法和装置
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Application No.: US12626559Application Date: 2009-11-25
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Publication No.: US08572528B1Publication Date: 2013-10-29
- Inventor: William E. Leigh , Kenneth R. Weidele
- Applicant: William E. Leigh , Kenneth R. Weidele
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent Kin-Wah Tong
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/455 ; G06F11/22

Abstract:
In one embodiment, a method and apparatus for analyzing a design of an integrated circuit (IC) are disclosed. For example, the method parses a netlist file of the IC where a module of the IC is parsed into a plurality of sub-modules in accordance with a hierarchical structure. The method traces through a connectivity of the plurality of sub-modules, and tabulates data associated with the connectivity with a fault cost associated with a structure of the IC.
Information query