Invention Grant
US08572528B1 Method and apparatus for analyzing a design of an integrated circuit using fault costs 有权
使用故障成本分析集成电路设计的方法和装置

Method and apparatus for analyzing a design of an integrated circuit using fault costs
Abstract:
In one embodiment, a method and apparatus for analyzing a design of an integrated circuit (IC) are disclosed. For example, the method parses a netlist file of the IC where a module of the IC is parsed into a plurality of sub-modules in accordance with a hierarchical structure. The method traces through a connectivity of the plurality of sub-modules, and tabulates data associated with the connectivity with a fault cost associated with a structure of the IC.
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