Invention Grant
- Patent Title: Waiving density violations
- Patent Title (中): 排除密度违规
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Application No.: US13304099Application Date: 2011-11-23
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Publication No.: US08572533B2Publication Date: 2013-10-29
- Inventor: John G. Ferguson , Bikram Garg
- Applicant: John G. Ferguson , Bikram Garg
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Waiver regions may be identified by waiver identification items. The waiver identification items may be determined based on conducting a density check process. Additionally or alternatively, reference patterns for pattern matching, cell names or markers may serve as the waiver identification items. Waiver geometric items may be created for the waiver regions and added to the layout design. Based on an overlap of a density check window with the waiver geometric items and waiving threshold information, a density violation in that density check window is determined to be reported as a density violation or a waived density violation with some implementations of the invention. With some other implementations of the invention, pattern density of a density check window may not be checked if an overlap of the density check window with the waiver geometric items is above a waiving threshold value.
Public/Granted literature
- US20130132918A1 Waiving Density Violations Public/Granted day:2013-05-23
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