Invention Grant
- Patent Title: Temperature measuring apparatus and temperature measuring method
- Patent Title (中): 温度测量仪和温度测量方法
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Application No.: US13428198Application Date: 2012-03-23
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Publication No.: US08573837B2Publication Date: 2013-11-05
- Inventor: Tatsuo Matsudo , Chishio Koshimizu
- Applicant: Tatsuo Matsudo , Chishio Koshimizu
- Applicant Address: JP
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2011-064462 20110323
- Main IPC: G01K11/00
- IPC: G01K11/00 ; B32B3/00

Abstract:
A temperature measuring apparatus and a temperature measuring method that may simultaneously measure temperatures of objects in processing chambers. The temperature measuring apparatus includes a first light separating unit which divides light from the light source into measurement lights; second light separating units which divide the measurement lights from the first light separating unit into measurement lights and reference lights; third light separating units which further divide the measurement lights into first to n-th measurement lights; a reference light reflecting unit which reflects the reference lights; an light path length changing unit which changes light path lengths of the reference lights reflected by the reference light reflecting unit; and photodetectors which measure interference between the first to n-th measurement lights reflected by the objects to be measured and the reference lights reflected by the reference light reflecting unit.
Public/Granted literature
- US20120243572A1 TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD Public/Granted day:2012-09-27
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