Invention Grant
US08574445B2 Method for generating hollow cathode plasma and method for treating large area substrate using hollow cathode plasma
失效
用于产生空心阴极等离子体的方法和使用空心阴极等离子体处理大面积衬底的方法
- Patent Title: Method for generating hollow cathode plasma and method for treating large area substrate using hollow cathode plasma
- Patent Title (中): 用于产生空心阴极等离子体的方法和使用空心阴极等离子体处理大面积衬底的方法
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Application No.: US12457279Application Date: 2009-06-05
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Publication No.: US08574445B2Publication Date: 2013-11-05
- Inventor: Jeonghee Cho , Jong Ryang Joo , Shinkeun Park
- Applicant: Jeonghee Cho , Jong Ryang Joo , Shinkeun Park
- Applicant Address: KR Gyeonggi-Do
- Assignee: PSK Inc.
- Current Assignee: PSK Inc.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2008-0073822 20080729
- Main IPC: C23F1/00
- IPC: C23F1/00

Abstract:
Provided are a method for generating hollow cathode plasma and a method for treating a large area substrate using the hollow cathode plasma. In the methods, the hollow cathode plasma is generated by a gas introduced between a hollow cathode in which a plurality of lower grooves where plasma is generated is defined in a bottom surface thereof and a baffle in which a plurality of injection holes is defined. A substrate disposed on a substrate support member is treated using the hollow cathode plasma passing through the injection holes. The uniform plasma having high density can be generated by hollow cathode effect due to the hollow cathode having the lower grooves and the injection holes of the baffle. Also, since the substrate can be treated using a hydrogen gas and a nitrogen gas in an ashing process, a damage of a low dielectric constant dielectric can be minimized.
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