Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US13403177Application Date: 2012-02-23
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Publication No.: US08575624B2Publication Date: 2013-11-05
- Inventor: Takahisa Kanemura , Masaki Kondo
- Applicant: Takahisa Kanemura , Masaki Kondo
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-175214 20110810
- Main IPC: H01L29/15
- IPC: H01L29/15

Abstract:
In one embodiment, a semiconductor device includes a semiconductor substrate, a gate electrode provided on the semiconductor substrate via an insulating layer, and a gate insulator provided on a side surface of the gate electrode. The device includes a stacked layer including a lower main terminal layer of a first conductivity type, an intermediate layer, and an upper main terminal layer of a second conductivity type which are successively stacked on the semiconductor substrate, the stacked layer being provided on the side surface of the gate electrode via the gate insulator. The upper or lower main terminal layer is provided on the side surface of the gate electrode via the gate insulator and the semiconductor layer.
Public/Granted literature
- US20130037823A1 SEMICONDUCTOR DEVICE Public/Granted day:2013-02-14
Information query
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