Invention Grant
- Patent Title: Capacitive semiconductor pressure sensor
- Patent Title (中): 电容半导体压力传感器
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Application No.: US13446976Application Date: 2012-04-13
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Publication No.: US08575710B2Publication Date: 2013-11-05
- Inventor: Flavio Francesco Villa , Gabriele Barlocchi , Pietro Corona , Benedetto Vigna , Lorenzo Baldo
- Applicant: Flavio Francesco Villa , Gabriele Barlocchi , Pietro Corona , Benedetto Vigna , Lorenzo Baldo
- Applicant Address: IT Agrate Brianza
- Assignee: STMicroelectronics S.r.l.
- Current Assignee: STMicroelectronics S.r.l.
- Current Assignee Address: IT Agrate Brianza
- Agency: Seed IP Law Group PLLC
- Priority: EP04425197 20040319
- Main IPC: H01L29/84
- IPC: H01L29/84

Abstract:
A capacitive semiconductor pressure sensor, comprising: a bulk region of semiconductor material; a buried cavity overlying a first part of the bulk region; and a membrane suspended above said buried cavity, wherein, said bulk region and said membrane are formed in a monolithic substrate, and in that said monolithic substrate carries structures for transducing the deflection of said membrane into electrical signals, wherein said bulk region and said membrane form electrodes of a capacitive sensing element, and said transducer structures comprise contact structures in electrical contact with said membrane and with said bulk region.
Public/Granted literature
- US20120223402A1 CAPACITIVE SEMICONDUCTOR PRESSURE SENSOR Public/Granted day:2012-09-06
Information query
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