Invention Grant
- Patent Title: Integrated circuit device and method of manufacturing the same
- Patent Title (中): 集成电路装置及其制造方法
-
Application No.: US13090606Application Date: 2011-04-20
-
Publication No.: US08575717B2Publication Date: 2013-11-05
- Inventor: Der-Chyang Yeh , Shang-Yun Hou
- Applicant: Der-Chyang Yeh , Shang-Yun Hou
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L29/86
- IPC: H01L29/86

Abstract:
Provided is a integrated circuit device and a method for fabricating the same. The integrated circuit device includes a semiconductor substrate having a dielectric layer disposed over the semiconductor substrate and a passive element disposed over the dielectric layer. The integrated circuit further includes an isolation matrix structure, underlying the passive element, wherein the isolation matrix structure includes a plurality of trench regions each being formed through the dielectric layer and extending into the semiconductor substrate, the plurality of trench regions further including an insulating material and a void area.
Public/Granted literature
- US20120267753A1 INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2012-10-25
Information query
IPC分类: