Invention Grant
- Patent Title: Method and apparatus to measure light intensity
- Patent Title (中): 测量光强度的方法和装置
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Application No.: US13325934Application Date: 2011-12-14
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Publication No.: US08575845B2Publication Date: 2013-11-05
- Inventor: Tobin D. Hagan , David L. Freeman , Marco Corsi
- Applicant: Tobin D. Hagan , David L. Freeman , Marco Corsi
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: H05B37/02
- IPC: H05B37/02 ; H05B37/00

Abstract:
A method for controlling a light emitting diode (LED) is provided. Initially, the LED, which had been active, is deactivated, and a voltage for a current that corresponds to the persistence of the LED is generated. The voltage is then integrated so as to generate an integrated voltage, and the integrated voltage is compared to a threshold. When the integrated voltage is less than the threshold, the LED is then activated.
Public/Granted literature
- US20130154483A1 METHOD AND APPARATUS TO MEASURE LIGHT INTENSITY Public/Granted day:2013-06-20
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