Invention Grant
- Patent Title: Inclination detection method and inclination detection apparatus
- Patent Title (中): 倾斜检测方法和倾斜检测装置
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Application No.: US12843818Application Date: 2010-07-26
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Publication No.: US08575919B2Publication Date: 2013-11-05
- Inventor: Hideaki Yamada , Michihiro Nagaishi
- Applicant: Hideaki Yamada , Michihiro Nagaishi
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: JP2009-173997 20090727
- Main IPC: G01P13/00
- IPC: G01P13/00 ; G01P15/00

Abstract:
An inclination detection method is disclosed, which uses a pair of electrodes placed so as to face each other and having a fixed positional relation and an electric conductor which can move between the pair of electrodes, wherein the pair of electrodes is in either a conducting state or a nonconducting state depending on the position of the movable electric conductor, the conducting state in a predetermined period is expressed as any one of a plurality of level values, and a movement state of the pair of electrodes is estimated based on which of the plurality of level values the conducting state takes on.
Public/Granted literature
- US20110018554A1 INCLINATION DETECTION METHOD AND INCLINATION DETECTION APPARATUS Public/Granted day:2011-01-27
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