Invention Grant
US08575952B2 Semiconductor device and test method 有权
半导体器件及测试方法

Semiconductor device and test method
Abstract:
A semiconductor device includes a first circuit block, a second circuit block, a first lead-out line coupled to the first circuit block, a second lead-out line coupled to the second circuit block, a first pad coupled to the first lead-out line, a second pad coupled to the second lead-out line, and a shielding line provided between the first lead-out line and the second lead-out line.
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