Invention Grant
- Patent Title: Smart edge detector
- Patent Title (中): 智能边缘检测器
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Application No.: US13551331Application Date: 2012-07-17
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Publication No.: US08575967B2Publication Date: 2013-11-05
- Inventor: Shu-Chun Yang , Jinn-Yeh Chien
- Applicant: Shu-Chun Yang , Jinn-Yeh Chien
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: H03K5/22
- IPC: H03K5/22

Abstract:
This description relates to an edge detector including a pulse generator configured to generate a first pulse when a first clock and a second clock are at a same logic level and generate a second pulse when the first clock and the second clock are at different logic levels. The edge detector further includes a first RC circuit configured to charge the first pulse and a second RC circuit configured to charge the second pulse. The edge detector further includes a circuitry that, based on a width of the first pulse or of the second pulse, is configured to provide a select signal to select an edge of the second clock for triggering.
Public/Granted literature
- US20120280718A1 SMART EDGE DETECTOR Public/Granted day:2012-11-08
Information query
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