Invention Grant
US08576309B2 Pixel defect correction device, imaging apparatus, pixel defect correction method, and program
有权
像素缺陷校正装置,成像装置,像素缺陷校正方法和程序
- Patent Title: Pixel defect correction device, imaging apparatus, pixel defect correction method, and program
- Patent Title (中): 像素缺陷校正装置,成像装置,像素缺陷校正方法和程序
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Application No.: US12923879Application Date: 2010-10-13
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Publication No.: US08576309B2Publication Date: 2013-11-05
- Inventor: Jun Hashizume
- Applicant: Jun Hashizume
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Rader, Fishman & Grauer PLLC
- Priority: JP2009-252448 20091102; JP2010-085351 20100401
- Main IPC: H04N9/64
- IPC: H04N9/64 ; H04N5/228 ; H04N5/208 ; G06K9/48 ; G06K9/40 ; G06K9/00

Abstract:
A pixel defect correction device includes: a defect determining section determining whether a pixel of interest of an image, in which pixels each having a pixel value are arrayed in a two-dimensional manner, is a defect of the image; a gradient detecting section detecting a gradient or an edge in a processing region, which includes pixels with the pixel of interest in the middle, based on values of at least peripheral pixels around the pixel of interest which are included in the processing region; a correction value acquisition section selecting a pixel, which is used for acquisition of a correction value of the pixel of interest, according to the detected gradient or edge and acquiring the correction value from a value of the selected pixel; and a defective pixel replacing section replacing the value of the pixel of interest with the correction value when the pixel of interest is determined to be a defect.
Public/Granted literature
- US20110102624A1 Pixel defect correction device, imaging apparatus, pixel defect correction method, and program Public/Granted day:2011-05-05
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