Invention Grant
US08576520B2 Method for detecting arcs in photovoltaic systems and such a photovoltaic system
有权
用于在光伏系统和这种光伏系统中检测电弧的方法
- Patent Title: Method for detecting arcs in photovoltaic systems and such a photovoltaic system
- Patent Title (中): 用于在光伏系统和这种光伏系统中检测电弧的方法
-
Application No.: US13389360Application Date: 2010-06-02
-
Publication No.: US08576520B2Publication Date: 2013-11-05
- Inventor: Andreas Pamer , Guenter Ritzberger , Friedrich Oberzaucher
- Applicant: Andreas Pamer , Guenter Ritzberger , Friedrich Oberzaucher
- Applicant Address: AT Pettenbach
- Assignee: Fronius International GmbH
- Current Assignee: Fronius International GmbH
- Current Assignee Address: AT Pettenbach
- Agency: Collard & Roe, P.C.
- Priority: ATA1285/2009 20090814
- International Application: PCT/AT2010/000194 WO 20100602
- International Announcement: WO2011/017721 WO 20110217
- Main IPC: H02H3/00
- IPC: H02H3/00 ; H02H3/10
Abstract:
The invention relates to a method for detecting arcs in a direct-current path of a photovoltaic system, wherein values of a current (IDC) of the direct-current path are detected during a repeating time frame (7) and a mean value (8) is generated, and such a photovoltaic system. In order to reliably detect arcs by means of a component of the photovoltaic system, values of a voltage (UDC), of the direct-current path are detected during the time frame (7) and a mean value (8, 8′) is generated, and at least one detection signal (9) and at least one detection threshold (10) are continuously calculated based on the mean values (8, 8′) for the current (IDC) and the voltage (UDC) by means of a calculation method.
Public/Granted literature
- US20120134058A1 METHOD FOR DETECTING ARCS IN PHOTOVOLTAIC SYSTEMS AND SUCH A PHOTOVOLTAIC SYSTEM Public/Granted day:2012-05-31
Information query
