Invention Grant
US08576617B2 Circuit and method for generating a reference level for a magnetic random access memory element
有权
用于产生用于磁随机存取存储器元件的参考电平的电路和方法
- Patent Title: Circuit and method for generating a reference level for a magnetic random access memory element
- Patent Title (中): 用于产生用于磁随机存取存储器元件的参考电平的电路和方法
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Application No.: US13293565Application Date: 2011-11-10
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Publication No.: US08576617B2Publication Date: 2013-11-05
- Inventor: Xiaochun Zhu , Xia Li , Wenqing Wu , Jung Pill Kim , Seung H. Kang
- Applicant: Xiaochun Zhu , Xia Li , Wenqing Wu , Jung Pill Kim , Seung H. Kang
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Sam Talpalatsky; Nicholas J. Pauley; Joseph Agusta
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/14

Abstract:
A method of establishing a reference level includes providing first and second non-overlapping paths from a first node to a second node, providing first and second reference magnetic random access memory (MRAM) elements in the first path, providing third and fourth reference MRAM elements in the second path, measuring a first value indicative of a resistance between the first node and the second node, and setting the reference level based at least in part on the measured value. Also an associated reference circuit.
Public/Granted literature
- US20130121066A1 CIRCUIT AND METHOD FOR GENERATING A REFERENCE LEVEL FOR A MAGNETIC RANDOM ACCESS MEMORY ELEMENT Public/Granted day:2013-05-16
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