Invention Grant
US08576656B2 Latency counter, semiconductor memory device including the same, and data processing system 有权
延迟计数器,包括其的半导体存储器件和数据处理系统

  • Patent Title: Latency counter, semiconductor memory device including the same, and data processing system
  • Patent Title (中): 延迟计数器,包括其的半导体存储器件和数据处理系统
  • Application No.: US12875272
    Application Date: 2010-09-03
  • Publication No.: US08576656B2
    Publication Date: 2013-11-05
  • Inventor: Hiroki Fujisawa
  • Applicant: Hiroki Fujisawa
  • Applicant Address: JP Tokyo
  • Assignee: Elpida Memory, Inc.
  • Current Assignee: Elpida Memory, Inc.
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2009-207003 20090908
  • Main IPC: G11C8/00
  • IPC: G11C8/00
Latency counter, semiconductor memory device including the same, and data processing system
Abstract:
A latency counter includes an input selecting circuit that selects one of a plurality of signal paths and supplies an internal command to the selected signal path, a shift circuit that switches a correspondence relation between the signal paths and a latch circuit, and an output selecting circuit that causes the internal command taken in the latch circuit to be output. The input selection circuit includes a timing control circuit allocated to each of the signal paths. The timing control circuit includes an SR latch circuit that is set by the internal command and is reset in response to deactivation of a corresponding count value. Therefore, it becomes possible to suppress shortening of an active period of the internal command that is output from the input selecting circuit.
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