Invention Grant
US08576961B1 System and method for adaptive overlap and add length estimation
有权
用于自适应重叠和加长度估计的系统和方法
- Patent Title: System and method for adaptive overlap and add length estimation
- Patent Title (中): 用于自适应重叠和加长度估计的系统和方法
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Application No.: US12484893Application Date: 2009-06-15
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Publication No.: US08576961B1Publication Date: 2013-11-05
- Inventor: Haidong Zhu , Dumitru Mihai Ionescu , Abu Amanullah
- Applicant: Haidong Zhu , Dumitru Mihai Ionescu , Abu Amanullah
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: H04L27/06
- IPC: H04L27/06
Abstract:
A method for determining an overlap and add length estimate comprises determining a plurality of correlation values of a plurality of ordered frequency domain samples obtained from a data frame; comparing the correlation values of a first subset of the samples to a first predetermined threshold to determine a first edge sample; comparing the correlation values of a second subset of the samples to a second predetermined threshold to determine a second edge sample; using the first and second edge samples to determine an overlap and add length estimate; and providing the overlap and add length estimate to an overlap and add circuit.
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