Invention Grant
US08576987B2 X-ray diagnostic apparatus and X-ray diagnostic method including switching an X-ray generator from an abnormal high voltage generator to a normal high voltage generator
有权
X射线诊断装置和X射线诊断方法,包括将X射线发生器从异常高压发生器切换到正常的高压发生器
- Patent Title: X-ray diagnostic apparatus and X-ray diagnostic method including switching an X-ray generator from an abnormal high voltage generator to a normal high voltage generator
- Patent Title (中): X射线诊断装置和X射线诊断方法,包括将X射线发生器从异常高压发生器切换到正常的高压发生器
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Application No.: US12892469Application Date: 2010-09-28
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Publication No.: US08576987B2Publication Date: 2013-11-05
- Inventor: Manabu Fukuwara , Mitsuru Sakata , Katsuie Ikawa
- Applicant: Manabu Fukuwara , Mitsuru Sakata , Katsuie Ikawa
- Applicant Address: JP Tokyo JP Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Otawara-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-271666 20091130
- Main IPC: H05G1/10
- IPC: H05G1/10 ; H05G1/26 ; H05G1/32 ; H05G1/58

Abstract:
According to one embodiment, an X-ray diagnostic apparatus includes X-ray generators, X-ray detectors, high voltage generators, a switching device, an abnormality detection unit and a control unit. The high voltage generators are configured to apply voltages to the X-ray generators. The switching device is configured to switch outputs from the high voltage generators to the X-ray generators. The abnormality detection unit is configured to detect an abnormality in the high voltage generators. The control unit is configured to control the switching device to switch from an output from a high voltage generator of which abnormality has been detected by the abnormality detection unit toward a corresponding X-ray generator to an output from another high voltage generator toward the corresponding X-ray generator.
Public/Granted literature
- US20110129067A1 X-RAY DIAGNOSTIC APPARATUS AND X-RAY DIAGNOSTIC METHOD Public/Granted day:2011-06-02
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