Invention Grant
US08577123B2 Method and system for evaluating contact elements 有权
用于评估接触元件的方法和系统

  • Patent Title: Method and system for evaluating contact elements
  • Patent Title (中): 用于评估接触元件的方法和系统
  • Application No.: US12524596
    Application Date: 2008-01-27
  • Publication No.: US08577123B2
    Publication Date: 2013-11-05
  • Inventor: Roni FlieswasserMichael Lev
  • Applicant: Roni FlieswasserMichael Lev
  • Applicant Address: IL Migdal Haemek
  • Assignee: Camtek Ltd.
  • Current Assignee: Camtek Ltd.
  • Current Assignee Address: IL Migdal Haemek
  • Agent Oren Reches
  • International Application: PCT/IL2008/000118 WO 20080127
  • International Announcement: WO2008/090563 WO 20080731
  • Main IPC: G06K9/00
  • IPC: G06K9/00 G01R31/20 G01N21/00
Method and system for evaluating contact elements
Abstract:
A method, system and a computer program product for evaluating contact elements, the method includes: acquiring images of multiple groups of contact elements, wherein each group of contact element was expected to be contacted during a test by the same group of probes so as to form multiple probe marks; and evaluating at least one characteristic of a first contact element in response to a comparison between a number of potential probe marks that appear in the image of a first contact element and a number of potential probe marks that appear in an image of a second contact element.
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