Invention Grant
- Patent Title: Method and system for evaluating contact elements
- Patent Title (中): 用于评估接触元件的方法和系统
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Application No.: US12524596Application Date: 2008-01-27
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Publication No.: US08577123B2Publication Date: 2013-11-05
- Inventor: Roni Flieswasser , Michael Lev
- Applicant: Roni Flieswasser , Michael Lev
- Applicant Address: IL Migdal Haemek
- Assignee: Camtek Ltd.
- Current Assignee: Camtek Ltd.
- Current Assignee Address: IL Migdal Haemek
- Agent Oren Reches
- International Application: PCT/IL2008/000118 WO 20080127
- International Announcement: WO2008/090563 WO 20080731
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01R31/20 ; G01N21/00

Abstract:
A method, system and a computer program product for evaluating contact elements, the method includes: acquiring images of multiple groups of contact elements, wherein each group of contact element was expected to be contacted during a test by the same group of probes so as to form multiple probe marks; and evaluating at least one characteristic of a first contact element in response to a comparison between a number of potential probe marks that appear in the image of a first contact element and a number of potential probe marks that appear in an image of a second contact element.
Public/Granted literature
- US20110096980A1 METHOD AND SYSTEM FOR EVALUATING CONTACT ELEMENTS Public/Granted day:2011-04-28
Information query