Invention Grant
- Patent Title: Magnetometer bias and anomaly detector
- Patent Title (中): 磁力计偏差和异常检测器
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Application No.: US13572441Application Date: 2012-08-10
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Publication No.: US08577640B2Publication Date: 2013-11-05
- Inventor: William Kerry Keal
- Applicant: William Kerry Keal
- Applicant Address: US CA San Jose
- Assignee: Invensense, Inc.
- Current Assignee: Invensense, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Sawyer Law Group, P.C.
- Main IPC: G01C19/00
- IPC: G01C19/00

Abstract:
The computer implemented method, system or computer program product comprises collecting magnetometer data from the device; and calculating a center of a shape of the magnetometer data as a result of minimization. The minimization of calculating the center of the shape further comprises calculating a plurality of running sums of the magnetometer data; storing the plurality of running sums; storing a count of the number of terms in each of the running sums; and calculating the center of the shape and setting the estimated magnetometer bias to the center of the shape. The radius of the sphere is calculated to ensure accuracy in the estimator of the magnetometer bias.
Public/Granted literature
- US20130046489A1 MAGNETOMETER BIAS AND ANOMALY DETECTOR Public/Granted day:2013-02-21
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