Systems for automatically calibrating a storage memory controller are disclosed. In some embodiments, the systems may be realized as a solid state device system with an electro-static discharge (ESD) protection capability. The system can include a memory controller electrically coupled to a channel, where the memory controller is configured to select at least one of a plurality of flash memory devices. The system can also include at least one isolation device including an ESD protection circuit, configured to electrically couple the channel to the at least one of the plurality of flash memory devices and to decouple the channel from the remaining of the plurality of flash memory devices.