Invention Grant
- Patent Title: Determining location of error detection data
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Application No.: US13006240Application Date: 2011-01-13
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Publication No.: US08578208B2Publication Date: 2013-11-05
- Inventor: Christian M. Gyllenskog , Phil W. Lee , Steven R. Narum
- Applicant: Christian M. Gyllenskog , Phil W. Lee , Steven R. Narum
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Methods, devices, and systems for determining location of error detection data are described. One method for operating a memory unit having a bad group of memory cells includes determining a location of where to store error detection data for data to be stored across a plurality of memory units, including the memory unit having the bad group, based at least partially on a location of the bad group and storing the error detection data in the determined location.
Public/Granted literature
- US20120185738A1 DETERMINING LOCATION OF ERROR DETECTION DATA Public/Granted day:2012-07-19
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