Invention Grant
- Patent Title: Verification apparatus and verification method
- Patent Title (中): 验证装置和验证方法
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Application No.: US12163486Application Date: 2008-06-27
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Publication No.: US08578308B2Publication Date: 2013-11-05
- Inventor: Yusuke Endoh , Takeo Imai , Hideji Kawata , Noritaka Kawakatsu
- Applicant: Yusuke Endoh , Takeo Imai , Hideji Kawata , Noritaka Kawakatsu
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
- Priority: JP2007-171113 20070628
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F17/10

Abstract:
A variable is allocated to a statement that designates an event associated with a function call in an assertion. Generation of the event at an arbitrary time on a continuous time series is detected, and a value corresponding to a meaning of the statement is assigned to the variable. Whether or not a condition corresponding to the meaning of the statement is satisfied is determined based on the value of the variable at each time on a discrete time series.
Public/Granted literature
- US20090019406A1 VERIFICATION APPARATUS AND VERIFICATION METHOD Public/Granted day:2009-01-15
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