Invention Grant
US08578309B2 Format conversion from value change dump (VCD) to universal verification methodology (UVM)
有权
从变更转储（VCD）到通用验证方法（UVM）的格式转换
- Patent Title: Format conversion from value change dump (VCD) to universal verification methodology (UVM)
- Patent Title (中): 从变更转储（VCD）到通用验证方法（UVM）的格式转换
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Application No.: US13362415Application Date: 2012-01-31
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Publication No.: US08578309B2Publication Date: 2013-11-05
- Inventor: Ashok Mehta , Stanley John , Sandeep Kumar Goel , Kai-Yuan Ting
- Applicant: Ashok Mehta , Stanley John , Sandeep Kumar Goel , Kai-Yuan Ting
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Agent Steven E. Koffs
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A system and method is disclosed for functional verification and/or simulation of dies in a multi-die 3D ICs. The system and method include converting an I/O trace, embodied as a Value Change Dump, to one or more Universal Verification Methodology objects. This conversion aids in identify and fixing issues contained in die.
Public/Granted literature
- US20130198706A1 FORMAT CONVERSION FROM VALUE CHANGE DUMP (VCD) TO UNIVERSAL VERIFICATION METHODOLOGY (UVM) Public/Granted day:2013-08-01
Information query
