Invention Grant
- Patent Title: System and method to map defect reduction data to organizational maturity profiles for defect projection modeling
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Application No.: US12558327Application Date: 2009-09-11
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Publication No.: US08578341B2Publication Date: 2013-11-05
- Inventor: Kathryn A. Bassin , Steven Kagan , Susan E. Skrabanek
- Applicant: Kathryn A. Bassin , Steven Kagan , Susan E. Skrabanek
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Matthew Chung
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A method is implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to receive a maturity level for an organization and select at least one defect analysis starter/defect reduction method (DAS/DRM) defect profile based on the maturity level. Additionally, the programming instructions are operable to determine a projection analysis for one or more stages of the life cycle of a software code project of the organization based on the at least one DAS/DRM defect profile.
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