Invention Grant
US08581194B2 Method and apparatus for measuring a spectrum of an optical sensor, advantageously in the infrared region
有权
用于在红外区域中有利地测量光学传感器的光谱的方法和装置
- Patent Title: Method and apparatus for measuring a spectrum of an optical sensor, advantageously in the infrared region
- Patent Title (中): 用于在红外区域中有利地测量光学传感器的光谱的方法和装置
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Application No.: US13324447Application Date: 2011-12-13
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Publication No.: US08581194B2Publication Date: 2013-11-12
- Inventor: Hakon Mikkelsen , Ralf Bernhard
- Applicant: Hakon Mikkelsen , Ralf Bernhard
- Applicant Address: DE Gerlingen
- Assignee: Endres + Hauser Conducta Gesellschaft für Mess-und Regeltechnik + Co. KG
- Current Assignee: Endres + Hauser Conducta Gesellschaft für Mess-und Regeltechnik + Co. KG
- Current Assignee Address: DE Gerlingen
- Agency: Bacon & Thomas, PLLC
- Priority: DE102010063533 20101220
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
A method for measuring a spectrum of an optical sensor, advantageously in the infrared region, in which a light beam impinges on an optical sensor in contact with a medium to be measured, wherein the optical sensor transmits a measurement beam changed by the medium to be measured and the measurement beam is fed to a pyrodetector, which issues output signals corresponding to the spectrum. The intensity of the measurement signal is modulated before impinging on a pyrodetector. In order to provide a cost effective, vibration free measuring apparatus, which has a long lifetime, intensity modulation of measurement beam occurs by tuning-in wavelengths contained in the optical spectrum of measuring beam.
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