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Invention Grant
US08582068B2 Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device 有权
具有开关元件连接和检查布线的有源矩阵基板，显示装置，有源矩阵基板检查方法以及检查显示装置的方法

Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device
Abstract:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
Abstract(Chinese):

有源矩阵基板设置有能够将检查信号输入到第一开关布线（69,74）中彼此不相邻的第一开关布线和不相邻的第二开关布线的第一检查布线（70,75） 以及第二检查布线（72,77），其能够将检查信号输入到彼此不相邻并且不连接到第一检查配线的第一切换布线的第一检测信号 开关布线（69,74）和与第二开关布线（69,74）之间不相邻并且不连接到第一检查布线的第二开关布线。

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