Invention Grant
US08584092B2 Methods and systems of determining risk levels of one or more software instance defects
失效
确定一个或多个软件实例缺陷的风险级别的方法和系统
- Patent Title: Methods and systems of determining risk levels of one or more software instance defects
- Patent Title (中): 确定一个或多个软件实例缺陷的风险级别的方法和系统
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Application No.: US12413745Application Date: 2009-03-30
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Publication No.: US08584092B2Publication Date: 2013-11-12
- Inventor: Shrirang V Yawalkar , Balaji Kumar
- Applicant: Shrirang V Yawalkar , Balaji Kumar
- Applicant Address: US NJ Basking Ridge
- Assignee: Verizon Patent and Licensing Inc.
- Current Assignee: Verizon Patent and Licensing Inc.
- Current Assignee Address: US NJ Basking Ridge
- Main IPC: G06F9/44
- IPC: G06F9/44
Abstract:
An exemplary method includes displaying a graphical user interface configured to facilitate identification of one or more defects within a software instance, receiving data representative of at least one instruction via the graphical user interface to assign a severity risk value, an impact risk value, and a likelihood risk value to each of the one or more defects, and generating a defect risk factor corresponding to each of the one or more defects that indicates a risk level of each of the one or more defects, the generating based on a combination of the severity risk value, the impact risk value, and the likelihood risk value corresponding to each of the one or more defects.
Public/Granted literature
- US20100251215A1 METHODS AND SYSTEMS OF DETERMINING RISK LEVELS OF ONE OR MORE SOFTWARE INSTANCE DEFECTS Public/Granted day:2010-09-30
Information query
