Invention Grant
- Patent Title: Chromatic point sensor compensation including workpiece material effects
- Patent Title (中): 色点传感器补偿包括工件材料效应
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Application No.: US13333944Application Date: 2011-12-21
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Publication No.: US08587789B2Publication Date: 2013-11-19
- Inventor: David William Sesko
- Applicant: David William Sesko
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
A method of error compensation in a chromatic point sensor (CPS) reduces errors associated with varying workpiece spectral reflectivity. The errors are associated with a distance-independent profile component of the CPS measurement signals. Workpiece spectral reflectivity may be characterized using known spectral reflectivity for a workpiece material, or by measuring the workpiece spectral reflectivity using the CPS system. CPS spectral reflectivity measurement may comprise scanning the CPS optical pen to a plurality of distances relative to a workpiece surface and determining a distance-independent composite spectral profile from a plurality of resulting wavelength peaks. By comparing the distance-independent composite spectral profile obtained from a workpiece with that corresponding to the CPS distance calibration procedure, the contribution of the reflectivity characteristics of the workpiece will be indicated in the differences between the profiles, and potential CPS position errors due to varying workpiece reflectivity characteristics may be calculated and/or compensated.
Public/Granted literature
- US20130163006A1 CHROMATIC POINT SENSOR COMPENSATION INCLUDING WORKPIECE MATERIAL EFFECTS Public/Granted day:2013-06-27
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