Invention Grant
US08587849B2 Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods
有权
成像系统,成像设备分析系统,成像设备分析方法和光束发射方法
- Patent Title: Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods
- Patent Title (中): 成像系统,成像设备分析系统,成像设备分析方法和光束发射方法
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Application No.: US11260915Application Date: 2005-10-27
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Publication No.: US08587849B2Publication Date: 2013-11-19
- Inventor: Anurag Gupta , Michael Long , Jeffrey M. DiCarlo
- Applicant: Anurag Gupta , Michael Long , Jeffrey M. DiCarlo
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H04N1/46
- IPC: H04N1/46

Abstract:
Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the wavelengths of the initial light forming a plurality of light beams comprising different wavelengths of light, after the filtering, optically communicating the light beams of the different wavelengths of light to an imaging device, receiving the light beams using the imaging device, and analyzing the imaging device using light, wherein the light beams comprising the different wavelengths of light are emitted beams after the receiving.
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