Invention Grant
- Patent Title: X-ray imaging apparatus and X-ray imaging method
- Patent Title (中): X射线成像装置和X射线成像方法
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Application No.: US13060739Application Date: 2009-10-19
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Publication No.: US08588366B2Publication Date: 2013-11-19
- Inventor: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- Applicant: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2008-273859 20081024; JP2009-132096 20090601
- International Application: PCT/JP2009/068297 WO 20091019
- International Announcement: WO2010/047401 WO 20100429
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
An X-ray imaging apparatus for obtaining information on a phase shift of an X-ray caused by an object comprises: an splitting element for splitting spatially an X-ray emitted from an X-ray generator unit into X-ray beams; an attenuator unit having an arrangement of attenuating elements for receiving the X-ray beams split by the splitting element; and an intensity detector unit for detecting intensities of X-ray beams attenuated by the attenuator unit; and the attenuating element changing continuously the transmission amount of the X-ray depending on the X-ray incident position on the element.
Public/Granted literature
- US20110158389A1 X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD Public/Granted day:2011-06-30
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