Invention Grant
- Patent Title: Conveyor diagnostic device and conveyor diagnostic system
- Patent Title (中): 输送机诊断装置和输送机诊断系统
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Application No.: US12917040Application Date: 2010-11-01
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Publication No.: US08589118B2Publication Date: 2013-11-19
- Inventor: Kimito Idemori , Takahiro Shirota , Hiroyuki Kobayashi , Katsuhiro Sumi , Tomohiko Tanimoto , Nobutaka Nishimura
- Applicant: Kimito Idemori , Takahiro Shirota , Hiroyuki Kobayashi , Katsuhiro Sumi , Tomohiko Tanimoto , Nobutaka Nishimura
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Priority: JP2009-253493 20091104
- Main IPC: G01C9/00
- IPC: G01C9/00 ; G06F15/00

Abstract:
According to one embodiment, a conveyor diagnostic device diagnoses an abnormal state of a cyclically moving conveyor. The conveyor diagnostic device includes a first tilt sensor, a second tilt sensor, a table, and a processing unit. The first and second tilt sensors are attached to a predetermined position of the conveyor and detect tilt angles of the conveyor in a vertical direction and horizontal direction, respectively. The table indicates a relationship between a tilt angle which changes in the vertical direction and sections included in one revolution of the conveyor. The processing unit specifies an abnormality occurrence position of the conveyor based on a tilt angle in the vertical direction, the table, and an elapsed time after ingression for a section corresponding to the tilt angle in the vertical direction, when a tilt angle in the horizontal direction exceeds a predetermined management limit value.
Public/Granted literature
- US20110106490A1 CONVEYOR DIAGNOSTIC DEVICE AND CONVEYOR DIAGNOSTIC SYSTEM Public/Granted day:2011-05-05
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