Invention Grant
US08589744B2 State machine transitioning between idle, capture, shift-I, and shift-2 states
有权
状态机在空闲，捕获，shift-I和shift-2状态之间转换
- Patent Title: State machine transitioning between idle, capture, shift-I, and shift-2 states
- Patent Title (中): 状态机在空闲，捕获，shift-I和shift-2状态之间转换
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Application No.: US13653716Application Date: 2012-10-17
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Publication No.: US08589744B2Publication Date: 2013-11-19
- Inventor: Lee D. Whetsel
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
Plural scan test paths (401) are provided to reduce power consumed during testing such as combinational logic (101). A state machine (408) operates according to plural shift states (500) to control each scan path in capturing data from response outputs of the combinational logic and then shifting one bit at a time to reduce the capacitive and constant state power consumed by shifting the scan paths.
Public/Granted literature
- US20130042161A1 LOW POWER TESTING OF VERY LARGE CIRCUITS Public/Granted day:2013-02-14
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